BS EN 61340-4-7:2017
$167.15
Electrostatics – Standard test methods for specific applications. Ionization
| Published By | Publication Date | Number of Pages |
| BSI | 2017 | 36 |
This part of IEC 61340 provides test methods and procedures for evaluating and selecting air ionization equipment and systems (ionizers).
This document establishes measurement techniques, under specified conditions, to determine offset voltage (ion balance) and decay (charge neutralization) time for ionizers.
This document does not include measurements of electromagnetic interference (EMI), or the use of ionizers in connection with ordnance, flammables, explosive items or electrically initiated explosive devices.
As contained in this document, the test methods and test conditions can be used by manufacturers of ionizers to provide performance data describing their products. Users of ionizers are urged to modify the test methods and test conditions for their specific application in order to qualify ionizers for use, or to make periodic verifications of ionizer performance. The user will decide the extent of the data required for each application.
Procedures and equipment described in this document can expose personnel to hazardous electrical and non-electrical conditions. Users of this document are responsible for selecting equipment that complies with applicable laws, regulatory codes and both external and internal policy. Users are cautioned that this document cannot replace or supersede any requirements for personnel safety.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | National foreword |
| 5 | English CONTENTS |
| 7 | FOREWORD |
| 9 | INTRODUCTION |
| 10 | 1 Scope 2 Normative references 3 Terms and definitions |
| 12 | 4 Test fixture and instrumentation |
| 13 | Figures Figure 1 – Charged plate monitor components for non-contacting plate measurement Figure 2 – Charged plate monitor components for contacting plate measurement |
| 14 | 5 Specific requirements for equipment categories 5.1 Specific requirements for all ionization equipment Figure 3 – Conductive plate detail for the non-contacting CPM Figure 4 – Conductive plate detail for the voltage follower CPM |
| 15 | 5.2 Room ionization Table 1 – Test set-ups and test locations/points (TP) |
| 16 | Figure 5 – Test locations for room ionization – AC grids and DC bar systems Figure 6 – Test locations for room ionization – Single polarity emitter systems |
| 17 | 5.3 Laminar flow hood ionization Figure 7 – Test locations for room ionization – Dual DC line systems Figure 8 – Test locations for room ionization – Pulsed DC emitter systems |
| 18 | Figure 9 – Test locations for vertical laminar flow hood – Top view Figure 10 – Test locations for vertical laminar flow hood – Side view |
| 19 | 5.4 Work surface ionization Figure 11 – Test locations for horizontal laminar flow hood – Top view Figure 12 – Test locations for horizontal laminar flow hood – Side view |
| 20 | Figure 13 – Test locations for benchtop ionizer – Top view |
| 21 | Figure 14 – Test locations for benchtop ionizer – Side view Figure 15 – Test locations for overhead ionizer – Top view |
| 22 | 5.5 Compressed gas ionizers – Guns and nozzles Figure 16 – Test locations for overhead ionizer – Side view |
| 23 | Figure 17 – Test locations for compressed gas ionizer (gun or nozzle) – Side view |
| 24 | Annex A (informative) Theoretical background and additional information on the standard test method for the performance of ionizers A.1 Introductory remarks A.2 Air ions A.3 Mobility and ion current A.4 Neutralization current |
| 25 | A.5 Neutralization rate A.6 Ion depletion and field suppression A.7 Charged plate monitor and charge neutralization |
| 26 | A.8 Relationship between charged plate monitor decay time and actual object A.9 Offset voltage A.10 Preparation of test area |
| 27 | A.11 Ion transport in airflow A.12 Obstruction of airflow around the charged plate monitor A.13 Effect of “air blanket” |
| 28 | A.14 Sources of measurement error A.14.1 Typical decay time variability A.14.2 Plate isolation A.14.3 Charging voltage A.14.4 Materials near the plate A.14.5 Other field-producing devices in test area A.14.6 Effect of offset voltage on decay time |
| 29 | A.15 Importance of ionization equipment maintenance |
| 30 | Annex B (normative) Method of measuring the capacitance of an isolated conductive plate B.1 Method B.2 Equipment B.3 Procedure B.4 Example |
| 31 | B.5 Sources of error B.5.1 Measuring equipment B.5.2 Poor plate isolation Table B.1 – Example measurement data |
| 32 | B.5.3 Objects in the environment B.5.4 Stray capacitance |
| 33 | Annex C (informative) Safety considerations C.1 General C.2 Electrical C.3 Ozone C.4 Radioactive C.5 X-ray C.6 Installation |
| 34 | Bibliography |
