{"id":81254,"date":"2024-10-17T18:52:52","date_gmt":"2024-10-17T18:52:52","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1620-2004\/"},"modified":"2024-10-24T19:46:10","modified_gmt":"2024-10-24T19:46:10","slug":"ieee-1620-2004","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1620-2004\/","title":{"rendered":"IEEE 1620 2004"},"content":{"rendered":"
New IEEE Standard – Inactive – Superseded. This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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2<\/td>\n | IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials <\/td>\n<\/tr>\n | ||||||
4<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
5<\/td>\n | Participants <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | 1. Overview 1.1 Scope 1.2 Purpose 1.3 Electrical characterization overview <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 2. Definitions, abbreviations, and acronyms 2.1 Definitions <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 2.2 Abbreviations and acronyms list <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 3. Standard OFET characterization procedures 3.1 Device structures 3.2 Guidelines for the OFET characterization process <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 3.3 Electrical standards <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 3.4 Reporting data <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 3.5 Environmental control and standards <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | Annex A <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Standard for Test Methods for the Characterization of Organic Transistors and Materials<\/b><\/p>\n |