| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
| 4<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
| 7<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | 1 Scope 2 Normative references 3 Terms, definitions, symbols, units and abbreviated terms 3.1 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | 3.2 Symbols, units and abbreviated terms <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 4 Basic transmission line formulae 4.1 Overview <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 4.2 Complex characteristic impedance and propagation coefficient formulae 4.2.1 General 4.2.2 Propagation coefficient <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 4.2.3 Complex characteristic impedance <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | 4.2.4 Phase and group velocity <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 4.3 High frequency representation of secondary parameters <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 4.4 Frequency dependence of the primary and secondary parameters 4.4.1 Resistance 4.4.2 Inductance 4.4.3 Complex characteristic impedance <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 4.4.4 Attenuation coefficient 4.4.5 Phase delay and group delay <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | 5 Measurement of the complex characteristic impedance 5.1 General Figures Figure 1 \u2013 Secondary parameters extending from 1 kHz to 1 GHz <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | 5.2 Open\/short circuit single-ended impedance measurement made with a balun (reference method) 5.2.1 Principle <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | 5.2.2 Test equipment 5.2.3 Procedure Figure 2 \u2013 Diagram of cable pair measurement circuit <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | 5.2.4 Expression of results 5.3 Function fitting the impedance magnitude and angle 5.3.1 General 5.3.2 Impedance magnitude <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | 5.3.3 Function fitting the angle of the complex characteristic impedance <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | 5.4 Complex characteristic impedance determined from measured phase coefficient and capacitance 5.4.1 General 5.4.2 Formulae for all frequencies case and for high frequencies <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | 5.4.3 Procedure for the measurement of the phase coefficient <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | 5.4.4 Phase delay Figure 3 \u2013 Determining the multiplier of 2\u03c0\uf020radians to add to the phase measurement <\/td>\n<\/tr>\n | ||||||
| 30<\/td>\n | 5.4.5 Phase velocity 5.4.6 Procedure for the measurement of the capacitance 5.5 Determination of the complex characteristic impedance using the terminated measurement method <\/td>\n<\/tr>\n | ||||||
| 31<\/td>\n | 5.6 Extended open\/short circuit method using a balun but excluding the balun performance 5.6.1 Test equipment and cableend preparation 5.6.2 Basic formulae 5.6.3 Measurement principle <\/td>\n<\/tr>\n | ||||||
| 32<\/td>\n | Figure 4 \u2013 Measurement configurations Figure 5 \u2013 Measurement principle with four terminal network theory <\/td>\n<\/tr>\n | ||||||
| 34<\/td>\n | 5.7 Extended open\/short circuit method without using a balun 5.7.1 Basic formulae and circuit diagrams <\/td>\n<\/tr>\n | ||||||
| 36<\/td>\n | 5.7.2 Measurement principle Figure 6 \u2013 Admittance measurement configurations Figure 7 \u2013 Admittance measurement principle <\/td>\n<\/tr>\n | ||||||
| 37<\/td>\n | 5.8 Open\/short impedance measurements at low frequencies with a balun <\/td>\n<\/tr>\n | ||||||
| 39<\/td>\n | 5.9 Complex characteristic impedance and propagation coefficient obtained from modal decomposition technique 5.9.1 General 5.9.2 Procedure <\/td>\n<\/tr>\n | ||||||
| 40<\/td>\n | 5.9.3 Measurement principle Figure 8 \u2013 Transmission line system <\/td>\n<\/tr>\n | ||||||
| 42<\/td>\n | 5.9.4 Scattering matrix to impedance matrix <\/td>\n<\/tr>\n | ||||||
| 44<\/td>\n | 5.9.5 Expression of results 6 Measurement of return loss and structural return loss 6.1 General 6.2 Principle <\/td>\n<\/tr>\n | ||||||
| 45<\/td>\n | 7 Propagation coefficient effects due to periodic structural variation related to the effects appearing in the structural return loss 7.1 General 7.2 Formula for the forward echoes caused by periodic structural inhomogeneities <\/td>\n<\/tr>\n | ||||||
| 47<\/td>\n | 8 Unbalance attenuation 8.1 General <\/td>\n<\/tr>\n | ||||||
| 48<\/td>\n | 8.2 Unbalance attenuation near end and far end Figure 9 \u2013 Differential-mode transmission in a symmetric pair Figure 10 \u2013 Common-mode transmission in a symmetric pair <\/td>\n<\/tr>\n | ||||||
| 49<\/td>\n | Tables Table 1 \u2013 Unbalance attenuation at near end Table 2 \u2013 Unbalance attenuation at far end Table 3 \u2013 Measurement set-up <\/td>\n<\/tr>\n | ||||||
| 50<\/td>\n | 8.3 Theoretical background Figure 11 \u2013 Circuit of an infinitesimal element of a symmetric pair <\/td>\n<\/tr>\n | ||||||
| 53<\/td>\n | 9 Balunless test method 9.1 Overall test arrangement 9.1.1 Test instrumentation Figure 12 \u2013 Calculated coupling transfer function for a capacitive coupling of 0,4 pF\/m and random \u00b10,4 pF\/m (=100 m; (r1 = (r2 = 2,3) Figure 13 \u2013 Measured coupling transfer function of 100 m Twinax 105 \u03a9 <\/td>\n<\/tr>\n | ||||||
| 54<\/td>\n | 9.1.2 Measurement precautions 9.1.3 Mixed mode S-parameter nomenclature <\/td>\n<\/tr>\n | ||||||
| 55<\/td>\n | Figure 14 \u2013 Diagram of a single-ended 4-port device Figure 15 \u2013 Diagram of a balanced 2-port device <\/td>\n<\/tr>\n | ||||||
| 56<\/td>\n | 9.1.4 Coaxial cables and interconnect for network analysers 9.1.5 Reference loads for calibration Table 4 \u2013 Mixed mode S-parameter nomenclature <\/td>\n<\/tr>\n | ||||||
| 57<\/td>\n | 9.1.6 Calibration Figure 16 \u2013 Solution for calibration of reference loads <\/td>\n<\/tr>\n | ||||||
| 58<\/td>\n | 9.1.7 Termination loads for termination of conductor pairs Figure 17 \u2013 Resistor termination networks <\/td>\n<\/tr>\n | ||||||
| 59<\/td>\n | 9.1.8 Termination of screens 9.1.9 Calibration 9.1.10 Establishment of noise floor 9.2 Cabling and cable measurements 9.2.1 Insertion loss and EL TCTL Table 5 \u2013 Requirements for terminations at calibration plane <\/td>\n<\/tr>\n | ||||||
| 61<\/td>\n | 9.2.2 NEXT Figure 18 \u2013 Insertion loss and EL TCTL <\/td>\n<\/tr>\n | ||||||
| 62<\/td>\n | Figure 19 \u2013 NEXT <\/td>\n<\/tr>\n | ||||||
| 63<\/td>\n | 9.2.3 ACR-F <\/td>\n<\/tr>\n | ||||||
| 64<\/td>\n | Figure 20 \u2013 FEXT <\/td>\n<\/tr>\n | ||||||
| 65<\/td>\n | 9.2.4 Return loss and TCL <\/td>\n<\/tr>\n | ||||||
| 66<\/td>\n | 9.2.5 PS alien near-end crosstalk (PS ANEXT-Exogenous crosstalk) Figure 21 \u2013 Return loss and TCL <\/td>\n<\/tr>\n | ||||||
| 68<\/td>\n | Figure 22 \u2013 Alien NEXT <\/td>\n<\/tr>\n | ||||||
| 69<\/td>\n | 9.2.6 PS attenuation to alien crosstalk ratio, far-end crosstalk (PS AACR-F- Exogenous crosstalk <\/td>\n<\/tr>\n | ||||||
| 70<\/td>\n | Figure 23 \u2013 Alien FEXT <\/td>\n<\/tr>\n | ||||||
| 72<\/td>\n | Annex A (informative)Example derivation of mixed mode parametersusing the modal decomposition technique Figure A.1 \u2013 Voltage and current on balanced DUT <\/td>\n<\/tr>\n | ||||||
| 74<\/td>\n | Figure A.2 \u2013 Voltage and current on unbalanced DUT <\/td>\n<\/tr>\n | ||||||
| 76<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Multicore and symmetrical pair\/quad cables for digital communications – Electrical transmission characteristics and test methods of symmetrical pair\/quad cables<\/b><\/p>\n |