{"id":413017,"date":"2024-10-20T05:53:10","date_gmt":"2024-10-20T05:53:10","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/astm-e431-6\/"},"modified":"2024-10-26T10:57:01","modified_gmt":"2024-10-26T10:57:01","slug":"astm-e431-6","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/astm\/astm-e431-6\/","title":{"rendered":"ASTM-E431"},"content":{"rendered":"

ASTM E431-96-Reapproved2022<\/h3>\n

Active Standard: Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices<\/h4>\n
\n

ASTM E431<\/h4>\n

Scope<\/strong><\/p>\n

\n

1.1<\/span> This guide provides illustrations of radiographs of semiconductors and related devices. Low powered transistors (through the TO-11 case configuration), diodes, low-power rectifiers, power devices, and integrated circuits are illustrated with common assembly features. Particular areas of construction are featured for these devices detailing critical points of design or assembly.<\/p>\n<\/p><\/div>\n

\n

1.2<\/span> This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.<\/i><\/p>\n<\/p><\/div>\n

\n

1.3<\/span> This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.<\/i><\/p>\n<\/p><\/div>\n

Keywords<\/strong><\/p>\n

electronic devices; nondestructive testing; radiographs; radiography; reference illustrations; semiconductors; x-ray;<\/p>\n

ICS Code<\/strong><\/p>\n

ICS Number Code 31.080.01 (Semi-conductor devices in general)<\/p>\n

DOI:<\/strong> 10.1520\/E0431-96R22<\/p>\n<\/div>\n","protected":false},"excerpt":{"rendered":"

E431-96(2022) Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
ASTM<\/b><\/a><\/td>\n2022<\/td>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":413023,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[573,2637],"product_tag":[],"class_list":{"0":"post-413017","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-31-080-01","7":"product_cat-astm","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/413017","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/413023"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=413017"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=413017"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=413017"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}