IEC 61788-22-3:2022 is applicable to the measurement of the dark count rate (DCR, RD) of superconductor strip photon detectors (SSPDs). It specifies terms, definitions, symbols and the measurement method of DCR that depends on the bias current (Ib) and operating temperature (T). NOTE The data of measurement results in Annex A are based on measurements of one institute only. The standard will be updated after the data of a complete round robin test are available.<\/p>\n
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| 2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
| 4<\/td>\n | European foreword Endorsement notice <\/td>\n<\/tr>\n | ||||||
| 5<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
| 7<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | 1 Scope 2 Normative references 3 Terms, definitions and abbreviated terms 3.1 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | Figures Figure 1 \u2013 Example of one dark count pulse in the pulse train in inset <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 3.2 Abbreviated terms 4 Principle of the measurement method <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 5 Apparatus 5.1 Detector packaging 5.2 Cryogenic system Figure 2 \u2013 Schematic curve of RD as a function of normalized bias current <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | Figure 3 \u2013 Schematic diagram of a typical DCR measurement system <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | 5.3 Measurement system Figure 4 \u2013 Equivalent circuit of the DCR measurement <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 6 Measurement procedure 6.1 Measurement of temperature 6.2 Measurement of switching current <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 6.3 Measurement of RD Figure 5 \u2013 Typical current-voltage (I-U) curve of an SSPD <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 7 Standard uncertainty 7.1 Type A uncertainty 7.2 Type B uncertainty <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 7.3 Uncertainty budget table <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | 7.4 Uncertainty requirement 8 Test report 8.1 Identification of device under test (DUT) 8.2 Measurement conditions and results Tables Table 1 \u2013 Uncertainty budget table for RD <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | 8.3 Miscellaneous optional report <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | Annex A (informative)Results of the round robin test A.1 DUT packages A.2 Measurement conditions Figure A.1 \u2013 Photograph of the DUT with an SSPD and a temperature sensor <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | A.3 Measurement results <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | Figure A.2 \u2013 I-U curve and RD curves Table A.1 \u2013 Test data of DUT <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | Table A.2 \u2013 Temperature sensitivity and bias current sensitivityabove a normalized bias current of 0,9 Table A.3 \u2013 uA and uB above a normalized bias current of 0,9 Table A.4 \u2013 Budget table for RD at a bias point of 5,25 \u00b5A (Ib\/Isw = 0,955) <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | Table A.5 \u2013 DCR values measured at a bias point of 5,25 \u00b5A (Ib\/Isw = 0,955) Table A.6 \u2013 Temperature measurement <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Superconductivity – Superconducting strip photon detector. Dark count rate<\/b><\/p>\n |