| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
| 4<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
| 6<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 8<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | 1 Scope 2 Normative references <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 3 Terms and definitions 4 Samples <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 5 Tests 5.1 General <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 5.2 Test procedures \u2013 Outdoor measurements 5.2.1 General 5.2.2 Apparatus Tables Table 1 \u2013 General schema of test procedures <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | Figures Figure 1 \u2013 Circuit suitable for electrical loading, application of system voltage bias and evaluation of leakage current from the module on the ground return-side <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 5.2.3 Optional monitoring Figure 2 \u2013 Module mounting configuration for isolation and measurement of current transfer to ground Figure 3 \u2013 Circuit suitable for electrical loading, application of system voltage bias and evaluation of leakage current from the module <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 5.2.4 Test conditions 5.2.5 Procedure <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | Figure 4 \u2013 Test flow for performing PID tests in the field associated with procedures described in 5.2.2 to 5.2.5 for evaluation of coulombic transfer from the cell circuit of the module to earth <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | 5.2.6 Acceleration by elevated system voltage testing outdoors <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | 5.3 Test procedures \u2013 Accelerated testing in environmental chamber 5.3.1 General <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | 5.3.2 Test of modules in the dark and unpowered state <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | Figure 5 \u2013 PID test flow for performing voltage stress test with module dark and unpowered <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | Figure 6 \u2013 Apparatus for applying system voltage bias (Vsys) to a PV module in an environmental chamber <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | Figure 7 \u2013 Example test time-temperature-humidity-voltage profile for application of stress in an environmental chamber <\/td>\n<\/tr>\n | ||||||
| 31<\/td>\n | 5.3.3 Testing in chamber with light bias or current <\/td>\n<\/tr>\n | ||||||
| 32<\/td>\n | Figure 8 \u2013 Schematic for isolated power supply for application of forward bias voltage (Vfwd) <\/td>\n<\/tr>\n | ||||||
| 33<\/td>\n | Figure 9 \u2013 Schematic for application of system voltage (Vsys) bias on test module on normally grounded parts <\/td>\n<\/tr>\n | ||||||
| 34<\/td>\n | Figure 10 \u2013 Apparatus for applying system voltage bias (Vsys) to a PV module in an environmental chamber under light bias <\/td>\n<\/tr>\n | ||||||
| 35<\/td>\n | Figure 11 \u2013 PID test flow for modules placed under voltage stress and with light bias or dark forward bias voltage <\/td>\n<\/tr>\n | ||||||
| 38<\/td>\n | 5.3.4 Acceleration factor determination\u2014coulomb basis <\/td>\n<\/tr>\n | ||||||
| 39<\/td>\n | 6 Test report <\/td>\n<\/tr>\n | ||||||
| 40<\/td>\n | Table 2 \u2013 PID chamber test report table (example) (Variables are given in 5.3.2.3.3.7 and 5.3.4.1) Table 3 \u2013 PID chamber recovery test report table (example) (Variables are given in 5.3.3.4) <\/td>\n<\/tr>\n | ||||||
| 42<\/td>\n | Annex A (normative)Evaluation for moisture ingress sensitivity A.1 General A.2 Procedure <\/td>\n<\/tr>\n | ||||||
| 43<\/td>\n | A.3 Evaluation Figure A.1 \u2013 Test flow for modules to detect and evaluate moisture ingress on PID rate <\/td>\n<\/tr>\n | ||||||
| 45<\/td>\n | Annex B (informative)Dew point and required chamber relative humidity (RH) setpoints depending on temperature difference between module and the chamber air Table B.1 \u2013 Dew point and required chamber relative humidity (RH) setpoints depending on temperature difference between module and the chamber air <\/td>\n<\/tr>\n | ||||||
| 46<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Photovoltaic (PV) modules. Test methods for the detection of potential-induced degradation – Thin-film<\/b><\/p>\n |