{"id":397708,"date":"2024-10-20T04:31:50","date_gmt":"2024-10-20T04:31:50","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1671-3-2017-2\/"},"modified":"2024-10-26T08:19:54","modified_gmt":"2024-10-26T08:19:54","slug":"ieee-1671-3-2017-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1671-3-2017-2\/","title":{"rendered":"IEEE 1671.3-2017"},"content":{"rendered":"
Revision Standard – Active. An exchange format utilizing Extensible Markup Language (XML) for both the static description of unit under test (UUT) and the specific description of UUT instance information is defined in this standard.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
1<\/td>\n | IEEE Std 1671.3\u2122-2017 Front Cover <\/td>\n<\/tr>\n | ||||||
2<\/td>\n | Title page <\/td>\n<\/tr>\n | ||||||
4<\/td>\n | Important Notices and Disclaimers Concerning IEEE Standards Documents <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Participants <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | Contents <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 1. Overview 1.1 Scope 1.2 Application <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 1.3 Conventions used within this document <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 2. Normative references <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 3. Definitions, acronyms, and abbreviations 3.1 Definitions <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 3.2 Acronyms and abbreviations <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 4. UUTDescription schema 4.1 Applicability 4.2 Describing UUT hierarchy 4.3 Using the hc:HardwareItemDescription type in the UUTDescription schema <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 4.4 Describing UUT digital serial buses 5. UUTInstance schema 5.1 Applicability <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 5.2 Describing UUT instance hierarchy 6. ATML UUT Description XML schema names and locations <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 7. ATML XML schema extensibility <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 8. Conformance <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | Annex A (normative) XML schemas A.1 UUTDescription XML schema <\/td>\n<\/tr>\n | ||||||
80<\/td>\n | A.2 UUTInstance XML schema <\/td>\n<\/tr>\n | ||||||
89<\/td>\n | Annex B (informative) IEEE download website material associated with this document <\/td>\n<\/tr>\n | ||||||
90<\/td>\n | Annex C (informative) Describing UUT serial digital buses <\/td>\n<\/tr>\n | ||||||
91<\/td>\n | C.1 Describing serial buses <\/td>\n<\/tr>\n | ||||||
93<\/td>\n | C.2 Describing serial bus nodes <\/td>\n<\/tr>\n | ||||||
95<\/td>\n | C.3 Describing serial bus messages <\/td>\n<\/tr>\n | ||||||
100<\/td>\n | Annex D (informative) User information and examples D.1 Line-replaceable unit UUT <\/td>\n<\/tr>\n | ||||||
101<\/td>\n | D.2 Circuit card assembly UUT <\/td>\n<\/tr>\n | ||||||
102<\/td>\n | D.3 UUTInstance D.4 Description of digital serial buses <\/td>\n<\/tr>\n | ||||||
103<\/td>\n | Annex E (informative) Bibliography <\/td>\n<\/tr>\n | ||||||
104<\/td>\n | Back Cover <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description<\/b><\/p>\n |