{"id":396440,"date":"2024-10-20T04:24:42","date_gmt":"2024-10-20T04:24:42","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1450-2-2002\/"},"modified":"2024-10-26T08:12:07","modified_gmt":"2024-10-26T08:12:07","slug":"ieee-1450-2-2002","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1450-2-2002\/","title":{"rendered":"IEEE 1450.2-2002"},"content":{"rendered":"
New IEEE Standard – Inactive-Reserved. Define structures in STIL for specifying the DC conditions for a device under test. Examples of the DC conditions for device power supplies are: device power supply setup, power sequencing to the device, power supply limit<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
1<\/td>\n | Cover <\/td>\n<\/tr>\n | ||||||
2<\/td>\n | IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450\u2122-1999) for DC Level Specification <\/td>\n<\/tr>\n | ||||||
4<\/td>\n | Introduction Participants <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | Contents <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | 1. Overview <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1.1 Scope <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 1.2 Purpose 2. References 3. Definitions, acronyms, and abbreviations 3.1 Definitions <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 3.2 Acronyms and abbreviations <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 4. Structure of this standard 5. Extensions to Clause 6, STIL syntax description 5.1 Additional reserved words 5.2 DC expressions and units (dc_expr) <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 5.3 Additions to STIL name spaces and name resolution (IEEE Std 1450-1999, 6.16) 6. Statement structure and organization of STIL information 6.1 Top-level statements and required ordering <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 6.2 Optional top-level statements 7. Extensions to Clause 8, STIL statement <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 7.1 STIL syntax 7.2 STIL example 8. Extensions to Clause 19, Spec and Selector blocks 9. Extensions to Clause 16, PatternExec block 9.1 PatternExec block syntax <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 9.2 PatternExec block example 9.3 DCLevels and DCSets usage in PatternExec and Pattern blocks 10. DCLevels block <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 10.1 DCLevels block syntax <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 10.2 DCLevels block example <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 10.3 InheritDCLevels Processing 10.4 InheritDCLevels example <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 11. DCSets block 11.1 DCSets block syntax 11.2 DCSets statement example 12. DCSequence block <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 12.1 DCSequence block syntax <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 12.2 DCSequence example <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | 13. Extensions to Clause 18, WaveformTable block 13.1 Event definition in WaveformTable block <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | 13.2 Mapping of event integers to DCLevels statements <\/td>\n<\/tr>\n | ||||||
30<\/td>\n | 13.3 DC levels switching example <\/td>\n<\/tr>\n | ||||||
31<\/td>\n | 14. Extensions to Clause 22, STIL Pattern statements 14.1 DCLevels statement 14.2 DCLevels statement example <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | Annex A\u2014DCLevels and DCSets usage example <\/td>\n<\/tr>\n | ||||||
38<\/td>\n | Annex B\u2014Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification<\/b><\/p>\n |