{"id":290946,"date":"2024-10-19T19:44:59","date_gmt":"2024-10-19T19:44:59","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-iso-ts-185072015\/"},"modified":"2024-10-25T16:46:00","modified_gmt":"2024-10-25T16:46:00","slug":"bsi-pd-iso-ts-185072015","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-iso-ts-185072015\/","title":{"rendered":"BSI PD ISO\/TS 18507:2015"},"content":{"rendered":"
This Technical Specification provides a framework on the uses of Total Reflection X-Ray Fluorescence (TXRF) spectroscopy for elemental qualitative and quantitative analysis of biological and environmental samples. It is meant to help technicians, biologist, doctors, environmental scientists, and environmental engineers to understand the possible uses of TXRF for elemental analysis by providing the guidelines for the characterization of biological and environmental samples with TXRF spectroscopy.<\/p>\n
Measurements can be made on equipment of various configurations, from laboratory instruments to synchrotron radiation beamlines or automated systems used in industry.<\/p>\n
This Technical Specification provides guidelines for the characterization of biological and environmental samples with TXRF spectroscopy. It includes the following: (a) description of the relevant terms; (b) sample preparation; (c) experimental procedure; (d) discussions on data analysis and result interpretation; (e) uncertainty; (f) case studies; and (g) references.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
7<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1\tScope 2\tNormative references 3\tTerms, definitions, symbols, and abbreviated terms 3.1\tTerms and definitions <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 3.2\tSymbols and abbreviated terms 4\tBackground 4.1\tPreliminary remarks <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 5\tInstrumentation 5.1\tInstrumental requirements 5.1.1\tX-ray sources of radiation <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 5.1.2\tMonochromator 5.1.3\tDetector <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 5.1.4\tSample station 5.1.5\tCritical and glancing angle <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 5.2\tQuality control of TXRF spectrometer 5.2.1\tStability check of X-ray beam 5.2.2\tSpectroscopic resolution <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 5.2.3\tEnergy calibration 5.2.4\tSensitivity test 6\tSpecimen preparation 6.1\tPreliminary remarks <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 6.2\tSample carriers 6.2.1\tChoice of sample carriers 6.2.2\tCleaning procedure for sample carriers <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 6.3\tSample treatment procedures for chemical analysis by TXRF 6.3.1\tLiquid samples <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 6.3.2\tSolid samples <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 6.3.3\tPreparation of the Internal Standard solution <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 7\tData Collection and Storage 7.1\tPreliminary remarks 7.2\tData collection 8\tData Analysis 8.1\tQualitative analysis 8.2\tQuantitative analysis 8.2.1\tPreliminary remarks 8.2.2\tBackground correction <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 8.2.3\tX-ray intensities of each element 8.2.4\tExperimental derivation of relative sensitivities 8.2.5\tQuantification by means of internal standard <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 8.2.6\tStatistical treatment 9\tInformation required when reporting TXRF analysis 9.1\tPreliminary remarks 9.2\tExperimental details <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 9.3\tAnalysis procedures <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | Annex\u00a0A (informative) Comparison of detection limits of TXRF, AAS, and ICP-MS <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | Annex\u00a0B (informative) Case studies of TXRF analysis for environmental applications <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | Annex\u00a0C (informative) Case studies of TXRF analysis for biological applications <\/td>\n<\/tr>\n | ||||||
35<\/td>\n | Annex\u00a0D (informative) Theoretical derivation of relative sensitivity factors <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis<\/b><\/p>\n |