{"id":290560,"date":"2024-10-19T19:43:07","date_gmt":"2024-10-19T19:43:07","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-162432011\/"},"modified":"2024-10-25T16:43:27","modified_gmt":"2024-10-25T16:43:27","slug":"bs-iso-162432011","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-162432011\/","title":{"rendered":"BS ISO 16243:2011"},"content":{"rendered":"
This International Standard specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X-ray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
7<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1\tScope 2\tNormative references 3\tTerms and definitions 4\tLevels of recording and reporting 4.1\tGeneral <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 4.2\tAnalyst\u2019s record <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 4.3\tSpectra 4.4\tQuantitative information <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 4.5\tCompositional depth profiles 4.6\tMaps and linescans <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 4.7\tChemical-state data 5\tRelease of data to the customer <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | Annex\u00a0A \n(informative)<\/p>\n Examples of spectra <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)<\/b><\/p>\n |