{"id":242438,"date":"2024-10-19T15:53:32","date_gmt":"2024-10-19T15:53:32","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iec-61000-4-362020\/"},"modified":"2024-10-25T10:46:14","modified_gmt":"2024-10-25T10:46:14","slug":"bs-iec-61000-4-362020","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iec-61000-4-362020\/","title":{"rendered":"BS IEC 61000-4-36:2020"},"content":{"rendered":"

This part of IEC 61000 provides methods to determine test levels for the assessment of the immunity of equipment and systems to intentional electromagnetic interference (IEMI) sources. It introduces the general IEMI problem, IEMI source parameters, derivation of test limits and summarises practical test methods.<\/p>\n

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PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
3<\/td>\nCONTENTS <\/td>\n<\/tr>\n
8<\/td>\nFOREWORD <\/td>\n<\/tr>\n
10<\/td>\nINTRODUCTION <\/td>\n<\/tr>\n
11<\/td>\n1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions <\/td>\n<\/tr>\n
15<\/td>\n3.2 Abbreviated terms <\/td>\n<\/tr>\n
16<\/td>\n4 General <\/td>\n<\/tr>\n
17<\/td>\n5 IEMI environments and interaction
5.1 General <\/td>\n<\/tr>\n
18<\/td>\n5.2 IEMI environments
5.2.1 Technical capability groups
5.2.2 IEMI deployment scenarios
5.2.3 Radiated IEMI environment summary
Tables
Table 1 \u2013 Possible IEMI deployment scenarios <\/td>\n<\/tr>\n
19<\/td>\n5.2.4 Published conducted IEMI environments
5.3 Interaction with victim equipment, systems and installations
5.3.1 General
Table 2 \u2013 Summary of high power radiated IEMI source output (rEfar) by capability group <\/td>\n<\/tr>\n
20<\/td>\n5.3.2 Protection level
Figures
Figure 1 \u2013 Example of radiated and conducted IEMI interaction with a building
Table 3 \u2013 Examples of protection levels <\/td>\n<\/tr>\n
21<\/td>\n6 Test methods
6.1 Derivation of applicable test methods <\/td>\n<\/tr>\n
22<\/td>\n6.2 Derivation of transfer functions
Figure 2 \u2013 Assessment options <\/td>\n<\/tr>\n
23<\/td>\n6.3 Radiated tests using IEMI simulator
6.4 Radiated tests using a reverberation chamber
6.5 Complex waveform injection (CWI)
6.6 Damped sinusoidal injection (DSI)
6.7 Electrostatic discharge (ESD)
6.8 Electrically fast transient (EFT) <\/td>\n<\/tr>\n
24<\/td>\n6.9 Antenna port injection
7 Test parameters
7.1 Derivation of immunity test parameters
7.2 Radiated test parameters
7.2.1 Generic hyperband test parameters (skilled capability group)
Figure 3 \u2013 Examples of ports <\/td>\n<\/tr>\n
25<\/td>\nTable 4 \u2013 Generic hyperband test parameters (skilled capability group)
Table 5 \u2013 Radiated hyperband test waveform and other pulse parameters <\/td>\n<\/tr>\n
26<\/td>\n7.2.2 Generic mesoband test parameters (skilled capability group)
Figure 4 \u2013 Example of hyperband waveform
Table 6 \u2013 Generic mesoband test parameters (skilled capability group) <\/td>\n<\/tr>\n
27<\/td>\nTable 7 \u2013 Comparison of quality factor (Q) with bandratio
Table 8 \u2013 Radiated mesoband waveform and other pulse parameters <\/td>\n<\/tr>\n
28<\/td>\n7.2.3 Generic hypoband test parameters (skilled capability group)
Figure 5 \u2013 Example of mesoband waveform
Table 9 \u2013 Generic hypoband\/narrowband test parameters (skilled capability group) <\/td>\n<\/tr>\n
29<\/td>\n7.3 Generic conducted IEMI test parameters
7.3.1 General
Figure 6 \u2013 Typical hypoband\/narrowband waveform
Table 10 \u2013 Conducted IEMI test levels <\/td>\n<\/tr>\n
30<\/td>\n7.3.2 Characteristics and performance of the fast damped oscillatory wave generator
Figure 7 \u2013 Waveform of the damped oscillatory wave (open circuit voltage)
Table 11 \u2013 Open circuit specifications <\/td>\n<\/tr>\n
31<\/td>\n7.4 Tailored test level derivation
7.5 Relevance of EMC immunity data
Table 12 \u2013 Short circuit specifications <\/td>\n<\/tr>\n
32<\/td>\nAnnexes
Annex A (informative) Failure mechanisms and performance criteria
A.1 General
A.2 Failure mechanisms
A.2.1 General <\/td>\n<\/tr>\n
33<\/td>\nA.2.2 Noise
A.2.3 Parameter offset and drifts
Figure A.1 \u2013 IEMI induced offset of sensor output \u2013 Corruption of information <\/td>\n<\/tr>\n
34<\/td>\nA.2.4 System upset or breakdown
A.2.5 Component destruction
Figure A.2 \u2013 Collision of an induced disturbance with data bits [A.1]
Figure A.3 \u2013 Examples of destruction on a chip [A.2] <\/td>\n<\/tr>\n
35<\/td>\nA.3 Effect of pulse width
A.4 Performance criteria
Figure A.4 \u2013 Generic failure trend as a function of pulse width <\/td>\n<\/tr>\n
36<\/td>\nA.5 References
Table A.1 \u2013 Recommended performance criteria <\/td>\n<\/tr>\n
38<\/td>\nAnnex B (informative) Developments in IEMI source environments
B.1 General
Figure B.1 \u2013 A comparison of HPEM and IEMI spectra [B.6] <\/td>\n<\/tr>\n
39<\/td>\nB.2 IEMI environment <\/td>\n<\/tr>\n
40<\/td>\nB.3 IEMI sources
Figure B.2 \u2013 Representation of typical IEMI radiation and coupling onto systems [B.3] <\/td>\n<\/tr>\n
41<\/td>\nFigure B.3 \u2013 Parameter space in power\/frequency occupied by sophisticated IEMI(i.e. DEW) sources in comparison to common RF systems [B.1]
Figure B.4 \u2013 Peak power and energy from continuous and pulsed (durations shown) microwave sources, narrowband and wideband <\/td>\n<\/tr>\n
42<\/td>\nFigure B.5 \u2013 Peak powers of various types ofpulsed hypoband\/narrowband sources [B.1]
Figure B.6 \u2013 Peak versus average power for microwavesources with duty factors indicated <\/td>\n<\/tr>\n
43<\/td>\nFigure B.7 \u2013 Phase coherence leading to a compact HPMsource with N2 scaling of output power
Figure B.8 \u2013 Briefcase mesoband DS source sold by Diehl-Rheinmetall [B.3] <\/td>\n<\/tr>\n
44<\/td>\nB.4 Published radiated IEMI environments
B.4.1 IEC 61000-2-13 [B.14]
B.4.2 Mil-Std-464C
Figure B.9 \u2013 A do-it-yourself electromagnetic weapon made from an oven magnetron [B.13]
Table B.1 \u2013 IEMI environments from IEC 61000-2-13 <\/td>\n<\/tr>\n
45<\/td>\nTable B.2 \u2013 Hypoband\/narrowband HPM environment from [B.17]
Table B.3 \u2013 Wideband (mesoband\/hyperband) HPM environment from [B.17] <\/td>\n<\/tr>\n
46<\/td>\nB.4.3 Selection of parameters for mesoband immunity test
Figure B.10 \u2013 Wideband (mesoband and hyperband) EME derived from [B.17] <\/td>\n<\/tr>\n
48<\/td>\nB.4.4 International Telecommunication Union (ITU)
B.5 Summary <\/td>\n<\/tr>\n
49<\/td>\nB.6 References
Figure B.11 \u2013 Plot of entire narrowband system weight as a function of output microwave power for land-mobile and land-transportable systems <\/td>\n<\/tr>\n
51<\/td>\nAnnex C (informative) Interaction with buildings
C.1 Building attenuation
Figure C.1 \u2013 Typical unprotected low-rise building plane wave E-field attenuation collected from references <\/td>\n<\/tr>\n
52<\/td>\nC.2 Coupling to cables
Table C.1 \u2013 Shielding effectiveness measurements for various power system buildings and rooms <\/td>\n<\/tr>\n
53<\/td>\nC.3 Low voltage cable attenuation
Figure C.2 \u2013 Cable coupling and resonance region <\/td>\n<\/tr>\n
54<\/td>\nC.4 References
Figure C.3 \u2013 Mains cable attenuation profile <\/td>\n<\/tr>\n
56<\/td>\nAnnex D (informative) Relation between plane wave immunity testing and immunity testing in a reverberation chamber
D.1 General <\/td>\n<\/tr>\n
57<\/td>\nD.2 Relation between measurements of shielding effectiveness in the two environments <\/td>\n<\/tr>\n
60<\/td>\nD.3 Relation between immunity testing in the two environments <\/td>\n<\/tr>\n
62<\/td>\nD.4 Additional aspects
D.5 References <\/td>\n<\/tr>\n
65<\/td>\nAnnex E (informative) Complex waveform injection \u2013 Test method
E.1 General
E.2 Prediction
E.2.1 General <\/td>\n<\/tr>\n
66<\/td>\nFigure E.1 \u2013 LLSC reference field measurement set-up <\/td>\n<\/tr>\n
67<\/td>\nFigure E.2 \u2013 LLSC induced current measurement set-up
Figure E.3 \u2013 Typical LLSC magnitude-only transfer function <\/td>\n<\/tr>\n
68<\/td>\nFigure E.4 \u2013 Prediction of induced current using minimum phase constraints <\/td>\n<\/tr>\n
69<\/td>\nE.2.2 Example
Figure E.5 \u2013 IEC 61000-2-9 early-time (E1) HEMP environment <\/td>\n<\/tr>\n
70<\/td>\nFigure E.6 \u2013 Overlay of transfer function and threat (frequency domain)
Figure E.7 \u2013 Predicted current <\/td>\n<\/tr>\n
71<\/td>\nE.3 Construction
Table E.1 \u2013 Time waveform norms <\/td>\n<\/tr>\n
72<\/td>\nFigure E.8 \u2013 Example of de-convolution result
Figure E.9 \u2013 Damped sinusoidal waveforms \u2013 Ten-component fit <\/td>\n<\/tr>\n
73<\/td>\nFigure E.10 \u2013 Approximated and predicted transient
Figure E.11 \u2013 Approximated and predicted transient (0 ns to 100 ns) <\/td>\n<\/tr>\n
74<\/td>\nFigure E.12 \u2013 Approximation and prediction transient \u2013 Frequency domain comparison <\/td>\n<\/tr>\n
75<\/td>\nE.4 Injection
Figure E.13 \u2013 Variation in error for an increasing number of damped sinusoids <\/td>\n<\/tr>\n
76<\/td>\nFigure E.14 \u2013 Complex injection set-up
Figure E.15 \u2013 Amplifier requirements for various current levels <\/td>\n<\/tr>\n
77<\/td>\nE.5 Summary
E.6 References
Figure E.16 \u2013 Comparison of predicted (green) and injected (red) current <\/td>\n<\/tr>\n
79<\/td>\nAnnex F (informative) Significance of test methodology margins
F.1 General
F.2 Examples
F.2.1 General <\/td>\n<\/tr>\n
80<\/td>\nF.2.2 Negative contributions
Figure F.1 \u2013 Variation in induced currents as a result of configuration <\/td>\n<\/tr>\n
81<\/td>\nFigure F.2 \u2013 Comparison of HPD and VPD induced currents
Figure F.3 \u2013 System variability <\/td>\n<\/tr>\n
82<\/td>\nF.2.3 Positive contributions
Figure F.4 \u2013 Comparison of single- and multi-port injection <\/td>\n<\/tr>\n
83<\/td>\nFigure F.5 \u2013 Example of transfer functions and worst-case envelope
Figure F.6 \u2013 Comparison of individual and worst-case transfer function predictions <\/td>\n<\/tr>\n
84<\/td>\nF.2.4 Summary
F.3 References
Figure F.7 \u2013 Comparison between predicted and measured induced currents <\/td>\n<\/tr>\n
85<\/td>\nAnnex G (informative) Intentional EMI \u2013 The issue of jammers
G.1 General
G.2 Effects <\/td>\n<\/tr>\n
86<\/td>\nG.3 Published accounts of jamming
G.4 Risk assessment
G.5 Mitigation <\/td>\n<\/tr>\n
87<\/td>\nG.6 References <\/td>\n<\/tr>\n
89<\/td>\nAnnex H (normative) Hyperband and mesoband radiated transients immunity test method
H.1 Overview
H.2 Test equipment
H.2.1 General
H.2.2 Test facility <\/td>\n<\/tr>\n
90<\/td>\nH.2.3 Hyperband transient pulse radiating test system
H.2.4 Mesoband transient pulse radiating test system
H.2.5 Measurement chain
Figure H.1 \u2013 Measurement chain for field uniformityassessment and transient responses <\/td>\n<\/tr>\n
91<\/td>\nH.3 Field uniformity assessment
H.3.1 Field uniformity assessment in an anechoic chamber <\/td>\n<\/tr>\n
92<\/td>\nFigure H.2 \u2013 Test set-up for field uniformity assessment in anechoic chamber <\/td>\n<\/tr>\n
94<\/td>\nH.3.2 Field uniformity in GTEM waveguide
H.4 Test set-up
H.4.1 General <\/td>\n<\/tr>\n
95<\/td>\nFigure H.3 \u2013 Example of test set-up for table-top equipment\/system
Figure H.4 \u2013 Example of test set-up for floor-standing equipment\/system <\/td>\n<\/tr>\n
96<\/td>\nH.4.2 Arrangement of table-top equipment
H.4.3 Arrangement of floor-standing equipment
H.4.4 Arrangement of wiring
Figure H.5 \u2013 Example of test set-up in GTEM waveguide <\/td>\n<\/tr>\n
97<\/td>\nH.5 Test procedure
H.5.1 General
H.5.2 Laboratory reference conditions
H.5.3 Execution of the test <\/td>\n<\/tr>\n
99<\/td>\nH.5.4 Evaluation of test results
H.6 Test report <\/td>\n<\/tr>\n
100<\/td>\nH.7 References <\/td>\n<\/tr>\n
101<\/td>\nAnnex I (informative) Calibration method and measurement uncertainty of sensors for the measurement of radiated hyperband and mesoband transient fields
I.1 General
I.2 Calibration method in TEM waveguides in IEC 61000-4-20:2010, Annex E [I.1]
I.2.1 General <\/td>\n<\/tr>\n
102<\/td>\nI.2.2 Probe calibration requirements <\/td>\n<\/tr>\n
103<\/td>\nI.2.3 Field probe calibration procedure in case of a one-port TEM waveguide
Figure I.1 \u2013 Example of the measurement points for the validation
Table I.1 \u2013 Calibration frequencies <\/td>\n<\/tr>\n
104<\/td>\nI.3 Calibration procedures for D-dot sensors in the time domain
I.3.1 General
Figure I.2 \u2013 Set-up for calibration of E-field probe in one-port TEM waveguide <\/td>\n<\/tr>\n
105<\/td>\nFigure I.3 \u2013 Cone and ground plane sensor calibration set-up <\/td>\n<\/tr>\n
106<\/td>\nI.4 Measurement uncertainty
Table I.2 \u2013 Type B expanded uncertainties for sensor calibrations in GTEM cell field generation system <\/td>\n<\/tr>\n
107<\/td>\nI.5 References
Table I.3 \u2013 Type B expanded uncertainties for sensor calibrations in the cone and ground plane cell field generation system <\/td>\n<\/tr>\n
108<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Electromagnetic compatibility (EMC) – Testing and measurement techniques. IEMI immunity test methods for equipment and systems<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2020<\/td>\n110<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":242442,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[626,2641],"product_tag":[],"class_list":{"0":"post-242438","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-33-100-20","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/242438","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/242442"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=242438"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=242438"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=242438"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}