IEEE C62.36 1995

$62.29

IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits

Published By	Publication Date	Number of Pages
IEEE	1995	46

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Description

Revision Standard – Inactive – Superseded. Methods are established for testing and measuring the characteristics of surge protectors used in low-voltage data, communications, and signaling circuits with voltages less than or equal to 1000 V rms or 1200 Vdc. The surge protectors are designed to limit voltage surges, current surges, or both. The surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear elements. Tests are included for characterizing standby performance, surge-limiting capabilities, and surge lifetime. Packaged single gas-tube, air-gap, varistor, or avalanche junction surge-protective devices are not covered, nor are test methods for low-voltage power circuit applications. You will receive an email from Customer Service with the URL needed to access this publication online.

PDF Catalog

PDF Pages	PDF Title
1	Title page
3	Introduction Participants
6	CONTENTS
8	1. Scope 2. References
9	3. Definitions 4. Service conditions 4.1 Normal service conditions
10	4.2 Unusual service conditions
11	4.3 Radiation 5. Basic configurations
12	6. Standard design test procedure 6.1 Standard design test criteria 6.2 Statistical procedures 6.3 Test conditions 7. Nonsurge performance tests 7.1 Rated voltage test
14	7.2 Rated current test 7.3 DC series resistance test 7.4 Standby current and insulation resistance test
16	7.5 Capacitance test 7.6 Inductance test 7.7 Analog insertion loss test 7.8 Phase shift test
19	7.9 Return loss test
20	7.10 Longitudinal balance test 7.11 Digital insertion loss test
21	7.12 Rise- and decay-time test
23	7.13 Bit error rate (BER) test
24	8. Active performance tests 8.1 DC-limiting-voltage test
25	8.2 Impulse-limiting-voltage test
29	8.3 Transition current test 8.4 Current-response-time test
31	8.5 Impulse reset test
33	8.6 Current reset test
36	8.7 AC life test
37	8.8 Impulse life test
39	8.9 Maximum single-impulse discharge test
40	8.10 Trip endurance test
41	8.11 Blocking-cycle life test 8.12 Environmental cycling with impulse surges test
43	8.13 Environmental cycling with ac surges test
44	9. Failure modes
45	Annex—Examples of internal arrangements of surge-limiting devices

Additional information

Standard Title	IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits
Published Code	IEEE
Publication Date	1995
Pages Count	46

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IEEE C62.36 1995

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