IEEE 1671.6-2015

$46.04

IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description

Published By	Publication Date	Number of Pages
IEEE	2015

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Description

Revision Standard – Active. An exchange format, using extensible markup language (XML), for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used with a test program set to test and diagnose a unit under test.

PDF Catalog

PDF Pages	PDF Title
1	IEEE Std 1671.6™-2015 Front cover
3	Title page
5	Important notices and disclaimers concerning IEEE standards documents
8	Participants
9	Introduction
10	Contents
11	Important notice 1. Overview 1.1 General
12	1.2 Application of this document’s annexes 1.3 Scope 1.4 Application 1.5 Conventions used within this document
13	2. Normative references
14	3. Definitions, acronyms, and abbreviations 3.1 Definitions
15	3.2 Acronyms and abbreviations
16	4. Schema—TestStationDescription.xsd 4.1 General 4.2 Elements
18	4.3 Child elements
19	4.4 Complex types
20	5. Schema—TestStationInstance.xsd 5.1 General 5.2 Elements
22	5.3 Child elements 5.4 Complex types
24	6. ATML TestStationDescription XML schema names and locations
25	7. ATML XML schema extensibility
26	8. Conformance 8.1 Conformance of a TestStationDescription instance document 8.2 Conformance of a TestStationInstance instance document
27	Annex A (informative) IEEE download website material associated with this document
28	Annex B (informative) User’s information and examples B.1 Partial automatic test station
31	Annex C (informative) Glossary
32	Annex D (informative) Bibliography
34	Back cover