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IEEE 1671.4 2014

$47.67

IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration

Published By Publication Date Number of Pages
IEEE 2014 54
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Revision Standard – Active. An exchange format is specified in this standard, using extensible markup language (XML), for identifying the test configuration used to test for and diagnose faults of a unit under test (UUT) on an automatic test system (ATS).

PDF Catalog

PDF Pages PDF Title
1 IEEE Std 1671.4ā„¢-2014 Front Cover
3 Title page
5 Important Notices and Disclaimers Concerning IEEE Standards Documents
8 Participants
9 Introduction
10 Contents
11 Important Notice
1. Overview
1.1 General
12 1.2 Application of this documentā€™s annexes
1.3 Scope
1.4 Application
13 1.5 Conventions used within this document
14 2. Normative references
3. Definitions, acronyms, and abbreviations
3.1 Definitions
15 3.2 Acronyms and abbreviations
17 4. TestConfiguration schema
4.1 Background
4.2 Test configuration.xsd
42 5. TestConfiguration instance schema
6. ATML TestConfiguration XML schema names and locations
44 7. ATML XML schema extensibility
8. Conformance
45 Annex A (informative) IEEE download web-site material associated with this document
46 Annex B (informative) Test Configuration XML element mappings to MTPSI card fields
51 Annex C (informative) Examples
54 Annex D (informative) Bibliography
IEEE 1671.4 2014
$47.67