IEEE 1620-2004
$80.71
Standard for Test Methods for the Characterization of Organic Transistors and Materials
| Published By | Publication Date | Number of Pages |
| IEEE | 2004 |
New IEEE Standard – Superseded. This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials |
| 4 | Introduction |
| 5 | Participants |
| 8 | 1. Overview 1.1 Scope 1.2 Purpose 1.3 Electrical characterization overview |
| 10 | 2. Definitions, abbreviations, and acronyms 2.1 Definitions |
| 12 | 2.2 Abbreviations and acronyms list |
| 13 | 3. Standard OFET characterization procedures 3.1 Device structures 3.2 Guidelines for the OFET characterization process |
| 15 | 3.3 Electrical standards |
| 16 | 3.4 Reporting data |
| 19 | 3.5 Environmental control and standards |
| 20 | Annex A |
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