IEEE 1241-2010

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IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters

Published By	Publication Date	Number of Pages
IEEE	2010	139

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Description

Revision Standard – Inactive-Reserved. The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.

PDF Catalog

PDF Pages	PDF Title
1	IEEE Std 1241™-2010 Front cover
3	Title page
6	Introduction
7	Notice to users Laws and regulations Copyrights Updating of IEEE documents Errata Interpretations Patents
8	Participants
10	Contents
13	Important notice 1. Overview 1.1 Scope 1.2 Purpose
14	1.3 Document organization 1.4 Analog-to-digital converter background
18	1.5 Guidance to the user
19	1.6 Manufacturer-supplied information
23	2. Normative references 3. Definitions and symbols 3.1 Definitions
30	3.2 Symbols and acronyms
32	4. General test methods 4.1 Introductory information on test methods 4.2 Test setup
34	4.3 Taking a record of data
35	4.4 Equivalent-time sampling and undersampling
40	5. Sine-wave testing and fitting 5.1 Introductory information on sine-wave testing and fitting 5.2 Curve fitting test method
41	5.3 Comment on three-parameter versus four-parameter sine fit 5.4 Choice of frequencies and record length
43	5.5 Selecting signal amplitudes 5.6 Presenting sine-wave data 5.7 Impurities of sine-wave sources
44	5.8 Estimating impurity problems from sine-fitting results
45	5.9 Measuring and controlling sine-wave impurities
46	6. Locating code transitions 6.1 Introductory information on locating code transitions
47	6.2 Locating code transitions using a feedback loop
49	6.3 Alternate code transition location method based on ramp histogram
51	6.4 Alternate code transition location method, based on sine-wave histogram
54	6.5 Determining the static transfer curve
55	7. Analog input 7.1 Input characteristics
56	7.2 Static input impedance versus input signal level 7.3 Static input current 7.4 Static gain and offset
58	8. Linearity 8.1 General comments on linearity 8.2 Integral nonlinearity
59	8.3 Absolute accuracy error 8.4 Differential nonlinearity and missing codes
60	8.5 Example INL and DNL data
61	8.6 Monotonicity
62	8.7 Hysteresis
63	8.8 Harmonic and spurious distortion
69	8.9 Intermodulation distortion
72	8.10 Noise power ratio
77	9. Noise (total) 9.1 General comments concering noise 9.2 Signal-to-noise-and-distortion ratio (SINAD)
78	9.3 Signal-to-noise ratio (SNR)
79	9.4 Effective number of bits (ENOB)
82	9.5 Random noise
85	10. Step response parameters 10.1 Step response definition 10.2 Test method for acquiring an estimate of the step response 10.3 Slew rate limit
86	10.4 Settling time parameters
87	10.5 Transition duration of step response 10.6 Overshoot and precursors
88	11. Frequency response parameters 11.1 Bandwidth (BW)
90	11.2 Gain error (gain flatness) 11.3 Frequency response and gain from step response
93	12. Differential gain and phase 12.1 Introductory information on differential gain and phase 12.2 Method for testing a general purpose ADC
96	12.3 Method for testing a special purpose ADC
97	12.4 Comments on differential phase and differential gain testing
98	13. Aperture effects 13.1 Introductory information on aperture effects 13.2 Aperture duration
103	13.3 Aperture delay
104	13.4 Aperture jitter
106	14. Additional tests and specification 14.1 Digital logic signals 14.2 Pipeline delay 14.3 Out-of-range recovery
107	14.4 Differential input specifications
109	14.5 Comments on reference signals
110	14.6 Power supply parameters
113	Annex A (informative) ADC architectures
120	Annex B (informative) Sine-wave fitting algorithms
124	Annex C (normative) Discrete Fourier transforms and windowing
130	Annex D (informative) Presentation of sine-wave data
137	Annex E (informative) Bibliography