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IEEE 1193 2004

$44.96

IEEE Guide for Measurement of Environmental Sensitivities of Standard Frequency Generators

Published By Publication Date Number of Pages
IEEE 2004 81
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Revision Standard – Active. Standard frequency generators that include all atomic frequency standards and precision quartz crystal oscillators are addressed.

PDF Catalog

PDF Pages PDF Title
1 IEEE Std 1193-2003 Cover
2 Title Page
4 Introduction
Participants
6 CONTENTS
8 1. Overview
1.1 Scope
1.2 Purpose
9 1.3 Summary
1.3.1 General considerations in the metrology of environmental sensitivities (refer to Clause 3)
1.3.2 Acceleration effects (refer to Clause 4)
1.3.3 Temperature, humidity, and pressure (refer to Clause 5)
10 1.3.4 Electric and magnetic fields
1.3.5 Ionizing and particle radiation (refer to Clause 7)
1.3.6 Aging, warm-up time, and retrace (refer to Clause 8)
2. References
11 3. General considerations in the metrology of environmental sensitivities and relativistic effects
3.1 General
3.2 Analytical methods
14 3.3 Measurement methods
16 3.4 Interactions among environmental stimuli
18 3.5 Error budgets
20 3.6 Transient effects and aging
22 3.7 Additional considerations
3.7.1 Relativistic effects on clocks
3.7.2 Testing microprocessor-driven clocks
23 4. Acceleration effects
4.1 Description of the phenomena
25 4.2 Effects and test methods
4.2.1 Quasi-static acceleration
27 4.2.2 Vibration effects
30 4.2.3 Shock
31 4.3 Other effects
4.3.1 Frequency multiplication
4.3.2 Large modulation index
4.3.3 Two-sample deviation
32 4.3.4 Integrated phase noise, phase excursions, jitter, and wander
33 4.3.5 Spectral responses at other than the vibration frequency
4.3.6 Acceleration effects on crystal filters
34 4.4 Special user notes
4.4.1 Interactions with other environmental effects and other pitfalls
35 4.4.2 Safety issues
36 5. Temperature, humidity, and pressure
5.1 Description of the phenomena
37 5.2 Effects and test methods
5.2.1 Effects of temperature, humidity, and pressure (THP)
39 5.2.2 Test methods for temperature, humidity, and pressure
40 5.2.3 Guidelines for documenting results
5.3 Special user notes
5.3.1 Device positioning
41 5.3.2 Temperature gradients
5.3.3 Sealed devices
5.3.4 Quartz crystals
42 5.3.5 Rubidium devices
5.3.6 Cesium beam devices
43 5.3.7 Hydrogen masers
5.3.8 Frequency drift and THP
5.3.9 Some pitfalls
44 6. Electric and magnetic field effects
6.1 Description of the phenomena
6.1.1 Electric field effects
6.1.2 Magnetic field effects
6.1.3 Electromagnetic interface (EMI) effects
6.2 Effects and test methods
6.2.1 Electric fields
45 6.2.2 Magnetic fields
47 6.2.3 Electromagnetic interference
49 6.3 Some pitfalls
7. Ionizing and particle radiation
7.1 Description of the phenomena
7.1.1 General discussion
7.1.2 Previous investigations
50 7.2 Effects and test methods
7.2.1 Total dose due to ionization
52 7.2.2 High dose rate environments
7.2.3 Electromagnetic pulse (EMP) effects
55 7.3 Special user notes
7.3.1 Response of frequency standards to radiation
56 7.3.2 Test procedures
58 7.3.3 Radiation test facilities
60 7.3.4 Single event phenomena
61 8. Aging, warm-up time, and retrace
8.1 Description of the phenomena
8.1.1 Aging
62 8.1.2 Warm-up time
63 8.1.3 Retrace
8.2 Effects and test methods
8.2.1 Aging
64 8.2.2 Warm-up time (Twu)
65 8.2.3 Retrace
66 8.3 Special user notes
8.3.1 Drift vs aging
8.3.2 Crystal oscillators
8.3.3 Rubidium frequency standards
67 8.3.4 Rubidium-crystal oscillators
8.3.5 Hydrogen masers
8.3.6 Cesium-beam frequency standards
68 Annex A – (informative) Bibliography
A.1 General considerations in the metrology of environmental sensitivities (Clause 3)
71 A.2 Acceleration effects (Clause 4)
73 A.3 Temperature, humidity, and pressure (Clause 5)
74 A.4 Electric and magnetic fields (Clause 6)
A.5 Ionizing and particle radiation (Clause 7)
76 A.6 Aging, warm-up time, and retrace (Clause 8)
IEEE 1193 2004
$44.96