BSI PD IEC/TS 62607-6-4:2016
$102.76
Nanomanufacturing. Key control characteristics – Graphene. Surface conductance measurement using resonant cavity
| Published By | Publication Date | Number of Pages |
| BSI | 2016 | 22 |
This part of IEC 62607 establishes a method for determining the surface conductance of two-dimensional (2D) single-layer or multi-layer atomically thin nano-carbon graphene structures. These are synthesized by chemical vapour deposition (CVD), epitaxial growth on silicon carbide (SiC), obtained from reduced graphene oxide (rGO) or mechanically exfoliated from graphite [3]. The measurements are made in an air filled standard R100 rectangular waveguide configuration, at one of the resonant frequency modes, typically at 7 GHz [4].
Surface conductance measurement by resonant cavity involves monitoring the resonant frequency shift and change in the quality factor before and after insertion of the specimen into the cavity in a quantitative correlation with the specimen surface area. This measurement does not explicitly depend on the thickness of the nano-carbon layer. The thickness of the specimen does not need to be known, but it is assumed that the lateral dimension is uniform over the specimen area.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 4 | CONTENTS |
| 5 | FOREWORD |
| 7 | INTRODUCTION |
| 8 | 1 Scope 2 Normative references 3 Terms and definitions 3.1 Graphene layers |
| 10 | 3.2 Measurement terminology |
| 11 | 4 Microwave cavity test fixture |
| 12 | 5 Test specimen 6 Measurement procedure 6.1 Apparatus Figures Figure 1 – Microwave cavity test fixture |
| 13 | 6.2 Calibration 6.3 Measurements 6.3.1 General 6.3.2 Empty cavity 6.3.3 Specimen |
| 14 | 6.3.4 Repeated procedure 6.3.5 Substrate 7 Calculations of surface conductance 8 Report |
| 15 | 9 Accuracy consideration |
| 16 | Annex A (informative) Case study of surface conductance measurement of single-layer and few-layer graphene A.1 General A.2 Cavity perturbation procedure |
| 17 | A.3 Experimental procedure A.4 Results |
| 18 | A.5 Surface conductance of single-layer graphene and few-layer graphene Figure A.1 – S21 magnitude of the resonant peak TE103 as a function of frequency at several specimen insertions (hx) Figure A.2 – Plots of 1/Qx − 1/Q0 as a function of the normalized specimen area (w hx). |
| 19 | A.6 Summary |
| 20 | Bibliography |
