BSI PD IEC TS 62196-3-1:2020
$198.66
Plugs, socket-outlets, vehicle connectors and vehicle inlets. Conductive charging of electric vehicles – Vehicle connector, vehicle inlet and cable assembly for DC charging intended to be used with a thermal management system
Published By | Publication Date | Number of Pages |
BSI | 2020 | 66 |
This document applies to accessories and cable assemblies with the same configuration as specified in IEC 62196-3:2014 with rated operating voltage not exceeding 1 500 V DC and a rated current not exceeding 500 A that employ
-
thermal sensing, or
-
thermal transport and thermal sensing
with the system architecture described in 4.101.
These accessories and cable assemblies are intended to be used in conductive charging systems for circuits specified in IEC 61851-23.
NOTE Edition 2 of IEC 61851-23 is under development.
The accessories covered by this document are intended to be used in charging mode 4 according to IEC 61851-1. These accessories are intended to be connected to cables according to the IEC 62893 series for DC cables.
PDF Catalog
PDF Pages | PDF Title |
---|---|
2 | undefined |
4 | CONTENTS |
7 | FOREWORD |
9 | INTRODUCTION |
10 | 1 Scope 2 Normative references |
11 | 3 Terms and definitions |
12 | 4 General |
13 | Tables Table 101 – Overview of applicable tests for different classifications of accessories |
17 | Table 102 – Test sequence A Table 103 – Test sequence B |
18 | Table 104 – Test sequence C Table 105 – Test sequence D |
19 | Figures Figure 101 – DC EV supply equipment with thermal sensing |
20 | 5 Ratings Figure 102 – DC EV supply equipment with thermal sensing, thermal transport and thermal exchange |
21 | 6 Connection between the power supply and the electric vehicle Table 106 – Overview of the DC vehicle interface |
22 | 7 Classification of accessories Table 107 – Overview of the combined AC/DC vehicle interface |
23 | 8 Marking 9 Dimensions 10 Protection against electric shock 11 Size and colour of protective earthing conductors Table 108 – Interface overview |
24 | 12 Provision for protective earthing 13 Terminals 14 Interlocks 15 Resistance to ageing of rubber and thermoplastic material 16 General construction Table 109 – Short-time test currents |
27 | 17 Construction of socket-outlets 18 Construction of plugs and vehicle connectors Table 110 – Properties of DC accessory contact plating for pin |
28 | 19 Construction of vehicle inlets 20 Degrees of protection 21 Insulation resistance and dielectric strength 22 Breaking capacity 23 Normal operation 24 Temperature rise Table 111 – Normal operation |
33 | 25 Flexible cables and their connection Table 112 – Pull force and torque test values for cable anchorage |
34 | 26 Mechanical strength Table 113 – Impact energy for ball impact test |
35 | 27 Screws, current-carrying parts and connections 28 Creepage distances, clearances and distances 29 Resistance to heat, to fire and to tracking 30 Corrosion and resistance to rusting 31 Conditional short-circuit current withstand test 32 Electromagnetic compatibility 33 Vehicle driveover Table 114 – Mechanical load flexing test |
38 | Annex A (normative)Specific information for configuration AA Figure A.1 – Reference device AA_0 |
39 | Figure A.2 – Test setup AA_0 Table A.1 – Maximum contact resistances and dimensions of reference device AA_0 |
40 | Figure A.3 – Test setup AA_1 |
41 | Figure A.4 – Test setup AA_2 Figure A.5 – Reference device AA_1 |
42 | Figure A.6 – Test setup AA_3 |
43 | Figure A.7 – Reference device AA_2 |
44 | Figure A.8 – Test setup AA_4 Figure A.9 – General test setup for temperature rise tests and thermal sensing device tests (configuration AA) |
45 | Figure A.10 – Plating of contacts for configuration AA Table A.2 – Dimensions for reference device conductor |
46 | Annex B (informative)Specific information for configuration BB |
47 | Annex C (normative)Specific information for configuration EE |
48 | Figure C.1 – Reference device EE_0 Table C.1 – Contact resistances and dimensions of reference device EE_0 |
49 | Figure C.2 – Test setup EE_0 Figure C.3 – Test setup EE_1 |
50 | Figure C.4 – Test setup EE_2 Figure C.5 – Reference device EE_1 |
51 | Figure C.6 – Test setup EE_3 Figure C.7 – Reference device EE_2 |
52 | Figure C.8 – Test setup EE_4 Figure C.9 – General test setup for temperature rise tests and thermal sensing device tests (configuration EE) |
53 | Table C.2 – Dimensions for reference device conductor (configuration EE) |
54 | Figure C.10 – Plating of contacts for configuration EE |
55 | Annex D (normative)Specific information for configuration FF |
56 | Figure D.1 – Reference device FF_0 Table D.1 – Contact resistances and dimensions of reference device FF_0 |
57 | Figure D.2 – Test setup FF_0 Figure D.3 – Test setup FF_1 |
58 | Figure D.4 – Test setup FF_2 |
59 | Figure D.5 – Reference device FF_1 Figure D.6 – Test setup FF_3 |
60 | Figure D.7 – Reference device FF_2 Figure D.8 – Test setup FF_4 |
61 | Figure D.9 – General test setup for temperature rise tests and thermal sensing device tests (configuration FF) Table D.2 – Dimensions for reference device conductor (configuration FF) |
62 | Figure D.10 – Plating of contacts for configuration FF |
63 | Annex E (informative)Recommended data |
64 | Bibliography |