BSI 19/30393421 DC:2019 Edition

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BS EN IEC 62899-503-3. Printed electronics – Part 503-3. Quality assessment. Measuring method of contact resistance for the printed thin film transistor by transfer length method

Published By	Publication Date	Number of Pages
BSI	2019	13

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Categories: 29.220.99 - Other cells and batteries, BSI

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Description

PDF Catalog

PDF Pages	PDF Title
5	FOREWORD
7	INTRODUCTION
8	1 Scope 2 Normative references 3 Terms, definitions and abbreviations 3.1 Terms and definitions 3.1.1 3.1.2 3.1.3 3.2 Abbreviations 4 Measuring method of contact resistance 4.1 General
9	4.2 Preparation of TEGs 4.3 Measuring apparatus 4.4 Environmental condition and precondition for measuring
10	4.5 Measuring procedure 4.6 Data analysis 4.6.1 Calculations procedure of normalized resistances for each TEGs 4.6.2 Derivation procedure of contact resistance
11	4.7 Report
12	Annex A (informative) Examples of sets of source and drain electrodes layouts in the TEG A.1 Examples of layouts of source and drain electrodes sets in TEG
13	Bibliography

Additional information

Status	Definitive
Pages	13
Publication Date	2019-08-16
Standard Number	19/30393421 DC
Title	BS EN IEC 62899-503-3. Printed electronics – Part 503-3. Quality assessment. Measuring method of contact resistance for the printed thin film transistor by transfer length method
Identical National Standard Of	119/280/CD, IEC 62899-503-3 Ed.1.0
Descriptors	LED, Test equipment, Electronic devices, Electronic equipment and components, Testing
Publisher	BSI
Committee	AMT/9
ICS Codes	29.220.99 - Other cells and batteries

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BSI 19/30393421 DC:2019 Edition

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