BS ISO 20263:2017:2018 Edition
$198.66
Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
| Published By | Publication Date | Number of Pages |
| BSI | 2018 | 54 |
This document specifies a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials. It is not intended to determine the simulated interface of the multi-layered materials expected through the multi-slice simulation (MSS) method. This document is applicable to the cross-sectional images of the multi-layered materials recorded by using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM) and the cross-sectional elemental mapping images by using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS). This document is also applicable to the digitized image recorded on an image sensor built into a digital camera, a digital memory set in the PC or an imaging plate and the digitalized image converted from an analogue image recorded on the photographic film by an image scanner.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | National foreword |
| 6 | Foreword |
| 7 | Introduction |
| 9 | 1 Scope 2 Normative references 3 Terms, definitions and abbreviated terms 3.1 Terms and definitions |
| 12 | 3.2 Abbreviated terms 4 Specimen preparation for cross-sectional imaging 4.1 General |
| 13 | 4.2 Requirements for the cross-sectional specimen |
| 14 | 5 Determination of an interface position 5.1 General 5.2 Preliminary considerations 5.2.1 Ideal model of an interface 5.2.2 More realistic model of an interface |
| 16 | 5.2.3 Dealing with intensity fluctuations in the image 6 Detailed procedure for determining the position of the interface 6.1 General |
| 18 | 6.2 Preparing cross-sectional TEM/STEM image 6.2.1 Preparing digitized Image |
| 19 | 6.2.2 Displaying the digitized image 6.3 Setting the ROI 6.3.1 General 6.3.2 Classification of image |
| 20 | 6.3.3 Procedure of setting the ROI |
| 25 | 6.4 Acquisition of the averaged intensity profile |
| 27 | 6.5 Moving-averaged processing |
| 28 | 6.6 Differential processing |
| 29 | 6.7 Final location of the interface |
| 30 | 7 Uncertainty 7.1 Uncertainty accumulating from each step of the procedure 7.2 Uncertainty of measurement result on image analysis |
| 32 | Annex A (informative) Examples of processing the real TEM/STEM images for three image types |
| 44 | Annex B (informative) Two main applications for this method |
| 51 | Annex C (informative) Calibration of scale unit: Pixel size calibration |
| 53 | Bibliography |
