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BS ISO 16243:2011

BS ISO 16243:2011

$102.76

Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)

Published By Publication Date Number of Pages
BSI 2011 20
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This International Standard specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X-ray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.

PDF Catalog

PDF Pages PDF Title
7 Foreword
8 Introduction
9 1 Scope
2 Normative references
3 Terms and definitions
4 Levels of recording and reporting
4.1 General
10 4.2 Analyst’s record
11 4.3 Spectra
4.4 Quantitative information
12 4.5 Compositional depth profiles
4.6 Maps and linescans
13 4.7 Chemical-state data
5 Release of data to the customer
14 Annex A
(informative)

Examples of spectra

17 Bibliography
BS ISO 16243:2011
$102.76