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BS EN IEC 60749-17:2019 – TC:2020 Edition

BS EN IEC 60749-17:2019 – TC:2020 Edition

$112.35

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods – Neutron irradiation

Published By Publication Date Number of Pages
BSI 2020 28
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IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test. This edition includes the following significant technical changes with respect to the previous edition:

  1. updates to better align the test method with MIL-STD 883J, method 1017, including removal of restriction of use of the document, and a requirement to limit the total ionization dose;
  2. addition of a Bibliography, including US MIL- and ASTM standards relevant to this test method.

PDF Catalog

PDF Pages PDF Title
16 undefined
19 English
CONTENTS
20 FOREWORD
22 1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
4.1 Test instruments
4.2 Radiation source
23 4.3 Dosimetry equipment
4.4 Dosimetry measurements
4.4.1 Neutron fluences
4.4.2 Dose measurements
5 Procedure
5.1 Safety requirements
5.2 Test samples
24 5.3 Pre-exposure
5.3.1 Electrical tests
5.3.2 Exposure set-up
5.4 Exposure
5.5 Post-exposure
5.5.1 Electrical tests
5.5.2 Anomaly investigation
5.6 Reporting
25 6 Summary
26 Bibliography

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BS EN IEC 60749-17:2019 - TC
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