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BS EN 61788-15:2011:2012 Edition

BS EN 61788-15:2011:2012 Edition

$198.66

Superconductivity – Electronic characteristic measurements. Intrinsic surface impedance of superconductor films at microwave frequencies

Published By Publication Date Number of Pages
BSI 2012 52
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This part of IEC 61788 describes measurements of the intrinsic surface impedance (ZS) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonatormethod [13, 14]2. The object of measurement is to obtain the temperature dependence of the intrinsic ZS at the resonant frequenc y f0.

The frequency and thickness range and the measurement resolution for the intrinsic ZS of HTS films are as follows:

  • f requency: up to 40 GHz;

  • f ilm thickness: greater than 50 nm ;

  • m easurement resolution: 0 ,01 mΩ at 10 GHz.

The intrinsic ZS data at the measured frequency, and that scaled to 10 GHz, assuming the f2 rule for the intrinsic surface resistance RS (f < 40 GHz) and the f rule for the intrinsic surface reactance XS for comparison, shall be reported.

PDF Catalog

PDF Pages PDF Title
6 English
CONTENTS
8 FOREWORD
10 INTRODUCTION
11 1 Scope
2 Normative references
3 Terms, definitions and general concepts
12 4 Requirements
13 5 Apparatus
5.1 Measurement equipment
5.2 Measurement apparatus
14 Figures
Figure 1 – Schematic diagram for the measurement equipment for the intrinsic ZSof HTS films at cryogenic temperatures
Figure 2 – Schematic diagram of a dielectric resonator with a switch for thermal connection
15 Figure 3 – Typical dielectric resonator with a movable top plate
16 Figure 4 – Switch block for thermal connection
17 5.3 Dielectric rods
Figure 5 – Dielectric resonator assembled with a switch block for thermal connection
18 5.4 Superconductor films and copper cavity
6 Measurement procedure
6.1 Set-up 
6.2 Measurement of the reference level
6.3 Measurement of the RS of oxygen-free high purity copper
Tables
Table 1 – Typical dimensions of a sapphire rod
Table 2 – Typical dimensions of OFHC cavities and HTS films
20 Figure 6 – A typical resonance peak. Insertion attenuation IA,resonant frequency f0 and half power bandwidth ∆f3dB are defined
21 6.4 Determination of the effective RS of superconductor films and tanδ of standard dielectric rods
Table 3 – Geometrical factors and filling factors calculatedfor the standard sapphire resonator
22 6.5 Determination of the penetration depth
Figure 7 – Reflection scattering parameters S11 and S22
24 6.6 Determination of the intrinsic surface impedance
25 7 Uncertainty of the test method
7.1 Measurement of unloaded quality factor
7.2 Measurement of loss tangent
Table 4 – Specifications of vector network analyzer
Table 5 – Type B uncertainty for the specifications on the sapphire rod
26 7.3 Temperature
7.4 Specimen and holder support structure
8 Test Report
8.1 Identification of test specimen
8.2 Report of the intrinsic ZS values
8.3 Report of the test conditions
Figure 8 – Definitions for terms in Table 5
28 Annex A (informative) Additional information relating to Clauses 1 to 8
Figure A.1 – Schematic diagram for the measurement system
29 Figure A.2 – A motion stage using step motors
30 Figure A.3 – Cross-sectional view of a dielectric resonator
34 Figure A.4 – A diagram for simplified cross-sectional view of a dielectric resonator
35 Table A.1 – Geometrical factors and filling factors calculatedfor the standard sapphire resonator
37 Figure A.5 – Mode chart for a sapphire resonator
38 Figure A.6 – Frequency response of the sapphire resonator
39 Figure A.7 – QU versus temperature for the TE021 and the TE012 modes of the sapphire resonator with 360 nm-thick YBCO films
Figure A.8 – The resonant frequency f0 versus temperature for the TE021 and TE012 modes of the sapphire resonator with 360 nm-thick YBCO films
40 Figure A.9 – The temperature dependence of the RSe of YBCO films with the thicknesses of 70 nm to 360 nm measured at ~40 GHz
Figure A.10 – The temperature dependence of ∆λe for the YBCO films with the thicknesses of 70 nm and 360 nm measured at ~40 GHz
41 Figure A.11 – The penetration depths λ of the 360 nm-thick YBCO film measured at 10 kHz by using the mutual inductance method and at ~40 GHz by using sapphire resonator
Figure A.12 – The temperature dependence of the intrinsic surface resistance RS of YBCO films with the thicknesses of 70 nm to 360 nm measured at ~40 GHz
42 Figure A.13 – Comparison of the temperature-dependent value of each term in Equation (A.35) for the TE021 mode of the standard sapphire resonator
Figure A.14 – Comparison of the temperature-dependent value of each term in Equation (A.35) for the TE012 mode of the standard sapphire resonator
43 Figure A.15 – Temperature dependence of uncertainty in the measured intrinsic RS of YBCO films
45 Annex B (informative) Uncertainty considerations
46 Table B.1 – Output signals from two nominally identical extensometers
Table B.2 – Mean values of two output signals
Table B.3 – Experimental standard deviations of two output signals
Table B.4 – Standard uncertainties of two output signals
47 Table B.5 – Coefficient of variations of two output signals
49 Bibliography

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BS EN 61788-15:2011
$198.66