BS EN 60749-5:2003
$86.31
Semiconductor devices. Mechanical and climatic test methods – Steady-state temperature humidity bias life test
| Published By | Publication Date | Number of Pages |
| BSI | 2003 | 12 |
Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
