ASTM-F676 2003
$35.75
F676-97(2003) Standard Test Method for Measuring Unsaturated TTL Sink Current (Withdrawn 2009)
| Published By | Publication Date | Number of Pages |
| ASTM | 2003 | 3 |
ASTM F676-97-Reapproved2003
Withdrawn Standard: Standard Test Method for Measuring Unsaturated TTL Sink Current (Withdrawn 2009)
ASTM F676
Scope
1.1 This test method covers the measurement of the unsaturated sink current of transistor-transistor logic (TTL) devices under specified conditions.
1.2 Units—The values stated in the International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
Keywords
hardness assurance; neutron degradation; sink current; transistor-transistor logic (TTL)
ICS Code
ICS Number Code n/a
DOI: 10.1520/F0676-97R03
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | Scope Referenced Documents Summary of Test Method Significance and Use Interferences Apparatus |
| 2 | Sampling Procedure FIG. 1 |
| 3 | Report Precision and Bias Keywords TABLE 1 |
