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ASTM-F1262M:2002 Edition

ASTM-F1262M:2002 Edition

$40.63

F1262M-95(2002) Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits

Published By Publication Date Number of Pages
ASTM 2002 5
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1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 10 3 Gy (Si)/s.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

PDF Catalog

PDF Pages PDF Title
1 Scope
Referenced Documents
Terminology
2 Summary of Guide
Significance and Use
Interferences
3 Apparatus
Procedure
5 Calculation
Report
Keywords

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