{"id":290895,"date":"2024-10-19T19:44:44","date_gmt":"2024-10-19T19:44:44","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-238332013\/"},"modified":"2024-10-25T16:45:40","modified_gmt":"2024-10-25T16:45:40","slug":"bs-iso-238332013","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-238332013\/","title":{"rendered":"BS ISO 23833:2013"},"content":{"rendered":"<p>This International Standard defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order.<\/p>\n<p>This International Standard is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of this International Standard are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.<\/p>\n<h4>PDF Catalog<\/h4>\n<table border=\"1px\" class=\"des-table\">\n<tr>\n<th>PDF Pages<\/th>\n<th>PDF Title<\/th>\n<\/tr>\n<tr>\n<td><b>6<b><\/td>\n<td>Foreword  <\/td>\n<\/tr>\n<tr>\n<td><b>7<b><\/td>\n<td>Introduction  <\/td>\n<\/tr>\n<tr>\n<td><b>9<b><\/td>\n<td>Section sec_1 <br \/> Section sec_2 <br \/> Section sec_3 <br \/> 1\tScope <br \/> 2\tAbbreviated terms <br \/> 3\tDefinitions of general terms used in electron probe microanalysis  <\/td>\n<\/tr>\n<tr>\n<td><b>15<b><\/td>\n<td>Section sec_4 <br \/> 4\tDefinition of terms used to describe EPMA instrumentation  <\/td>\n<\/tr>\n<tr>\n<td><b>25<b><\/td>\n<td>Section sec_5 <br \/> 5\tDefinitions of terms used in EPMA methodology  <\/td>\n<\/tr>\n<tr>\n<td><b>35<b><\/td>\n<td>Reference ref_1 <br \/> Reference ref_2 <br \/> Reference ref_3 <br \/> Reference ref_4 <br \/> Reference ref_5 <br \/> Reference ref_6 <br \/> Reference ref_7 <br \/> Reference ref_8 <br \/> Reference ref_9 <br \/> Reference ref_10 <br \/> Reference ref_11 <br \/> Reference ref_12 <br \/> Bibliography  <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"<p><b>Microbeam analysis. Electron probe microanalysis (EPMA). Vocabulary<\/b><\/p>\n<table class=\"shortdes-table\" style=\"width: 100%\" border=\"0\" cellspacing=\"0\" cellpadding=\"0\">\n<tbody>\n<tr>\n<td>Published By<\/td>\n<td>Publication Date<\/td>\n<td>Number of Pages<\/td>\n<\/tr>\n<tr>\n<td><a href=\"https:\/\/pdfstandards.shop\/product-category\/publishers\/bsi\/\"><b>BSI<\/b><\/a><\/td>\n<td>2013<\/td>\n<td>38<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":290900,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[52,2641],"product_tag":[],"class_list":{"0":"post-290895","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-01-040-71","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/290895","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/290900"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=290895"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=290895"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=290895"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}