31.080.99 - Other semiconductor devices
Showing 257–272 of 299 results
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BSI DD IEC/PAS 60747-17:2011
Semiconductor devices. Discrete devices – Magnetic and capacitive coupler for basic and reinforced isolation Published…
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BS EN 62047-19:2013
Semiconductor devices. Micro-electromechanical devices – Electronic compasses Published By Publication Date Number of Pages BSI…
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BS EN 62047-12:2011
Semiconductor devices. Micro-electromechanical devices – Bending fatigue testing method of thin film materials using resonant…
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BS EN 62047-14:2012
Semiconductor devices. Micro-electromechanical devices – Forming limit measuring method of metallic film materials Published By…
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BS EN 62047-17:2015
Semiconductor devices. Micro-electromechanical devices – Bulge test method for measuring mechanical properties of thin films…
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BS EN 62047-18:2013
Semiconductor devices. Micro-electromechanical devices – Bend testing methods of thin film materials Published By Publication…
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BS EN 62047-15:2015
Semiconductor devices. Micro-electromechanical devices – Test method of bonding strength between PDMS and glass Published…
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BS EN 62047-13:2012
Semiconductor devices. Micro-electromechanical devices – Bend-and shear-type test methods of measuring adhesive strength for MEMS…
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BS EN 62047-11:2013
Semiconductor devices. Micro-electromechanical devices – Test method for coefficients of linear thermal expansion of free-standing…
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BS EN 62047-10:2011
Semiconductor devices. Micro-electromechanical devices – Micro-pillar compression test for MEMS materials Published By Publication Date…
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BS IEC 60747-14-3:2009
Semiconductor devices – Semiconductor sensors. Pressure sensors Published By Publication Date Number of Pages BSI…
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BS EN 60747-16-5:2013
Semiconductor devices – Microwave integrated circuits. Oscillators Published By Publication Date Number of Pages BSI…
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BS EN 62258-2:2011
Semiconductor die products – Exchange data formats Published By Publication Date Number of Pages BSI…
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BS EN 62047-8:2011
Semiconductor devices. Micro-electromechanical devices – Strip bending test method for tensile property measurement of thin…
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BS EN 62047-7:2011
Semiconductor devices. Micro-electromechanical devices – MEMS BAW filter and duplexer for radio frequency control and…
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BSI PD IEC/TR 62258-8:2008
Semiconductor die products – EXPRESS model schema for data exchange Published By Publication Date Number…