31.080.99 - Other semiconductor devices
Showing 225–240 of 299 results
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BS IEC 62830-6:2019
Semiconductor devices. Semiconductor devices for energy harvesting and generation – Test and evaluation methods for…
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BS IEC 60747-5-8:2019
Semiconductor devices – Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies of light…
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BS IEC 63068-2:2019
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices…
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BSI 19/30364443 DC:2019 Edition
BS EN IEC 62047-35. Semiconductor devices. Micro-electromechanical devices – Part 35. Test method of electrical…
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BS IEC 62047-32:2019
Semiconductor devices. Micro-electromechanical devices – Test method for the nonlinear vibration of MEMS resonators Published…
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BS IEC 62951-6:2019
Semiconductor devices. Flexible and stretchable semiconductor devices – Test method for sheet resistance of flexible…
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BS EN IEC 60747-16-6:2019
Semiconductor devices – Microwave integrated circuits. Frequency multipliers Published By Publication Date Number of Pages…
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BS IEC 62951-4:2019
Semiconductor devices. Flexible and stretchable semiconductor devices – Fatigue evaluation for flexible conductive thin film…
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BS IEC 62951-3:2018
Semiconductor devices. Flexible and stretchable semiconductor devices – Evaluation of thin film transistor characteristics on…
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BS IEC 62951-2:2019
Semiconductor devices. Flexible and stretchable semiconductor devices – Evaluation method for electron mobility, sub-threshold swing,…
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BS IEC 62830-4:2019
Semiconductor devices. Semiconductor devices for energy harvesting and generation – Test and evaluation methods for…
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BS IEC 62047-31:2019
Semiconductor devices. Micro-electromechanical devices – Four-point bending test method for interfacial adhesion energy of layered…
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BS IEC 62951-7:2019
Semiconductor devices. Flexible and stretchable semiconductor devices – Test method for characterizing the barrier performance…
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BS IEC 63068-1:2019
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices…
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BS IEC 60747-18-1:2019
Semiconductor devices – Semiconductor bio sensors. Test method and data analysis for calibration of lens-free…
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BS EN IEC 62969-4:2018
Semiconductor devices. Semiconductor interface for automotive vehicles – Evaluation method of data interface for automotive…